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  • About Omni-Tech
  • Accessories
  • PH20 5-axis Touch-Trigger System
  • CMM Interface
  • CMM Products Repair
  • CMM Probe Shanks
  • CMM Probe
  • Datum Calibration Sphere
  • Extension Bars
  • Fixed and Manual Probe Heads
  • Gram Gauge
  • M5 Styli for Analog Probe
  • M5 Styli for Measuring Probe
  • Machine Products Machine Tool Repair
  • Manual Auto Joint Probe Stand
  • MSR1 Change Rack
  • Products
  • Repair Service
  • Repair by exchange
  • RPT20
  • Renishaw Equatorâ„¢
  • Renishaw Stylus Tools
  • Special Probe Systems
  • Styli for Faro CMM Arms
  • Touch Probe
CMM Services Services
  • Break down repair service
  • Calibration and Preventive Maintenance
  • Part Program Generation
  • Software Upgrades
  • Installation of New Control
    Hardware
  • Total CMM Rebuild Packages
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Special Probe Systems
Welcome to OMNI-TECH
FCR25 fl exible change rack
FCR25 fl exible change rack
FCR25-L6 change rack unit
FCR25-L6 change rack unit
SM25-2 scanning module
SM25-2 scanning module
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For over 20 years, service to you, our client, has been the main focus at Omni-Tech. We provide the special probe systems such as scanning probe products, metrology solutions and the highest quality stylus for your machine. Omni-Tech is also CMM repair services, retrofit, software and CMM machine sales – both new and used. Our service group and technicians are ISO 17025 accredited through A2LA, guaranteeing that our procedures exceed current industry standards.

  • Metrology solutions
  • Scanning Probe Systems
  • Advanced laser measurement systems
  • Reverse engineer stylus machine
Our special probe systems provide unmatched flexibility for your metrology measurement solutions. Renishaw SP25M, SP80, SP80H, and SP600 Scanning probe systems are miniature measuring machines that can acquire several hundred surface points each second. Your CMM software can use this data to provide you with information about the form of the features that you measure, as well as their size and position. Scanning probe systems can also be used to acquire discrete points in a similar way to touch-trigger probes.

Renishaw scanning probes feature innovative, lightweight passive mechanisms (no motors or locking mechanisms) that exhibit a high natural frequency, making them suitable for high speed scanning. Isolated optical metrology systems measure the deflection of the stylus directly for better accuracy and faster dynamic response. A range of metrology solutions are available, suitable for all sizes and configurations of CMM.

Renishaw products reduce process time, and minimize the costs associated with poor quality for a wide range of machining and measurement applications.

Omni-Tech is dedicated to helping you increase productivity with our skillful service and support.
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